Surface Analysis

UHV-Surface Analysis System

UHV- surface analysis system with STM Multichamber

ESCA / AUGER spectroscopy system

Design: ESCA / AUGER spectroscopy system for UPS, XPS, AES, STM/AFM, RHEED, LEED application

XPS / UPS Chamber

XPS/UPS chamber as additional analytical equipment for an OMBD-Cluster-tool


Conferences 2018

Bestec supports the following conferences:

SRI 2018 Taipei, Taiwan

MEDSI 2018 Paris, France

Plasma Surface Engineering 2018 Garmisch Patenkirchen, Germany

Tenth Joint BER II and BESSY II Berlin, Germany