Experimental Stations

X-ray Microscope

tool for observation of surfaces and bulk samples with nanometer precision

VUV Ellipsometer

The Bestec VUV ellipsometer is a complete UHV system dedicated to VUV ellipsometry experiments at synchrotron radiation sources.


Conferences 2018

Bestec supports the following conferences:

SRI 2018 Taipei, Taiwan

MEDSI 2018 Paris, France

Plasma Surface Engineering 2018 Garmisch Patenkirchen, Germany

Tenth Joint BER II and BESSY II Berlin, Germany